Tat-Hean Gan
Tat-Hean Gan is the Director of Innovation and Skills at TWI Ltd and Director of the Brunel Innovation Centre (BIC). He is also the Director of the National Structural Integrity Research Centre (NSIRC), the UK’s first industry-led postgraduate education and research centre in structural integrity, which is based at TWI. He is currently managing the TWI Core Research Programme (CRP) and TWI Certification Ltd. He led the formation of the £1.2billion TWI Innovation Network which comprised of universities, RTOs, SMEs and large enterprises.
Graduating with a first-class honours degree in electrical and electronics engineering from the University of Nottingham. He went on to pursue his M.Sc. degree in Advanced Mechanical Engineering and graduated with a distinction from the University of Warwick in 1998, and continued his Ph.D. studies in Engineering specializing in advanced ultrasonic imaging at the same University. In 2006, he completed his Executive MBA degree at the University of Birmingham. He has worked as an academic and in industry for many years. He has published more than 100 papers and has contributed to several books in the field of non-destructive testing (NDT). Tat-Hean is currently a Professor at Brunel University London, where he is also the Professor of Structural Integrity in the College of Engineering, Design and Physical Sciences.
His research interest is in signal and image processing, sensor development, artificial intelligence, digital twin, asset integrity management and structural assessment. He was a recipient of The Welding Institute Lidstone Award, who is deemed to have made the most significant contribution to the advancement of welding technology. He has obtained his CEng, CMgr, EurIng and IntPE(UK) status and he is also Fellows of the Institute of Engineering and Technology, British Institute of Non-Destructive Testing, International Society of Condition Monitoring, International Society of Engineering Asset Management, The Welding Institute and Chartered Management Institute.
